DocumentCode
1691601
Title
Carrier to Interference Ratio Analysis for the Shotgun Cellular System
Author
Madhusudhanan, Prasanna ; Restrepo, Juan G. ; Liu, Youjian Eugene ; Brown, Timothy X.
Author_Institution
Dept. of Electr. & Comput. Eng., Univ. of Colorado, Boulder, CO, USA
fYear
2009
Firstpage
1
Lastpage
6
Abstract
This paper analyzes the carrier-to-interference ratio of the so-called shotgun cellular system (SCS). In the SCS, base-stations are placed randomly according to a two-dimensional Poisson point process. Such a system can model a dense cellular or wireless data network deployment, where the base station locations end up being close to random due to constraints other than optimal coverage. The SCS is a simple cellular system where we can introduce several variations and design scenarios such as shadow fading, power control features, and multiple channel reuse groups, and assess their impact on the performance. We first derive an analytical expression for the characteristic function of the inverse of the carrier-to-interference ratio. Using this result, we show that the carrier-to-interference ratio is independent of the base station density and further, we derive a semi-analytical expression for the tail-probability. These results enable a complete characterization of the cellular performance of the SCS. Next, we incorporate shadow fading into the SCS and demonstrate that it merely scales the base station density by a constant. Hence, the cellular performance of the SCS is independent of shadow fading. These results are further used to analyze dense cellular scenarios.
Keywords
cellular radio; interference (signal); stochastic processes; Poisson point process; carrier to interference ratio analysis; shotgun cellular system; wireless data network; Base stations; Cellular networks; Fading; Interchannel interference; Mathematics; Measurement; Performance analysis; Power control; Power system modeling; Tail;
fLanguage
English
Publisher
ieee
Conference_Titel
Global Telecommunications Conference, 2009. GLOBECOM 2009. IEEE
Conference_Location
Honolulu, HI
ISSN
1930-529X
Print_ISBN
978-1-4244-4148-8
Type
conf
DOI
10.1109/GLOCOM.2009.5425785
Filename
5425785
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