DocumentCode :
169236
Title :
Using a collaboration model to classify artifacts in Software Product Line for Collaborative Systems
Author :
Pereira Bispo, Cristiana ; David, Jose Maria N. ; Maciel, Rita Suzana P.
Author_Institution :
Salvador Univ., Salvador, Brazil
fYear :
2014
fDate :
21-23 May 2014
Firstpage :
523
Lastpage :
528
Abstract :
Collaborative Systems can be constructed through Software Product Line (SPL) with the support of the Model-Driven Development (MDD) approach. However, models generated as SPL artifacts usually present only feature classification. Such models neither express the purpose of each SPL artifact of the systems composition nor the way they were associated with the collaboration elements. Therefore, to support the analysis and design of collaborative systems it is relevant to classify artifacts with the support of a collaborative model. This paper describes a way a collaboration model can be used to construct a UML profile. This profile is applied to MDD models that represent collaboration artifacts, enhancing the classification, location and reuse of artifacts in order to support the development of Collaborative Systems.
Keywords :
Unified Modeling Language; groupware; pattern classification; software product lines; MDD models; SPL artifact classification enhancement; UML profile; artifact location enhancement; artifact reuse enhancement; collaboration elements; collaboration model; collaborative systems; feature classification; model-driven development approach; software product line; Analytical models; Collaborative software; Collaborative work; Computational modeling; Computer integrated manufacturing; Unified modeling language; Collaborative Systems; Groupware; MDA; MDD; Profile; Software Product Lines;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Supported Cooperative Work in Design (CSCWD), Proceedings of the 2014 IEEE 18th International Conference on
Conference_Location :
Hsinchu
Type :
conf
DOI :
10.1109/CSCWD.2014.6846899
Filename :
6846899
Link To Document :
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