• DocumentCode
    1694486
  • Title

    Modeling of high-injection effects in bipolar devices

  • Author

    Rinaldi, N.F.

  • Author_Institution
    Dept. of Electron. Eng., Naples Univ., Italy
  • Volume
    2
  • fYear
    1995
  • Firstpage
    665
  • Abstract
    An analytical model for minority-carrier transport and recombination in quasi-neutral regions at arbitrary injection levels is presented. The proposed approach retains a general dependence of the transport parameter on the doping concentration, and can be thus applied to arbitrary doping profiles. It also includes heavy doping effects and injection-dependent recombination mechanisms. Simple closed-form analytical expressions are derived for the minority-carrier currents in bipolar transistors, and for the effective recombination velocity of high-low junctions
  • Keywords
    bipolar transistors; doping profiles; electron-hole recombination; heavily doped semiconductors; minority carriers; p-n junctions; semiconductor device models; solar cells; analytical model; bipolar device modelling; bipolar transistors; carrier recombination; doping concentration; doping profiles; effective recombination velocity; heavy doping effects; high-injection effects; high-low junctions; injection-dependent recombination mechanisms; minority-carrier currents; minority-carrier transport; quasi-neutral regions; solar cells; Analytical models; Bipolar transistors; Closed-form solution; Doping profiles; Electrons; Equations; Radiative recombination; Semiconductor device doping; Semiconductor process modeling; Spontaneous emission;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microelectronics, 1995. Proceedings., 1995 20th International Conference on
  • Conference_Location
    Nis
  • Print_ISBN
    0-7803-2786-1
  • Type

    conf

  • DOI
    10.1109/ICMEL.1995.500945
  • Filename
    500945