• DocumentCode
    1695294
  • Title

    Author index

  • fYear
    2009
  • Firstpage
    95
  • Lastpage
    95
  • Abstract
    The author index contains an entry for each author and coauthor included in the proceedings record.
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Memory Technology, Design, and Testing, 2009. MTDT '09. IEEE International Workshop on
  • Conference_Location
    Hsinchu
  • Print_ISBN
    978-0-7695-3797-9
  • Type

    conf

  • DOI
    10.1109/MTDT.2009.32
  • Filename
    5280080