Title :
A Model for Measuring the R&D Projects Similarity Using Patent Information
Author :
Jong-bae Kim ; Jung-Won Byun
Author_Institution :
Grad. Sch. of Software, Soongsil Univ., Seoul, South Korea
Abstract :
It is important to analyze the similarity of R&D projects for efficient investments of government´s budgets. In this study, we represent the methods of analyzing the similarity between R&D projects using patent information. For this, we propose a model for similarity measurement based on the set theories and probability theory.
Keywords :
investment; patents; probability; project engineering; public finance; research and development; R and D project similarity; government budgets; investments; patent information; probability theory; Educational institutions; Fingerprint recognition; Government; Patents; Redundancy; Set theory; Text analysis;
Conference_Titel :
Information Science and Applications (ICISA), 2014 International Conference on
Conference_Location :
Seoul
Print_ISBN :
978-1-4799-4443-9
DOI :
10.1109/ICISA.2014.6847333
