DocumentCode :
1697052
Title :
Calculating error of measurement on high speed microprocessor test
Author :
Comard, Tamorah ; Joshi, Madhukar ; Morin, Donald A. ; Sprague, Kimberley
Author_Institution :
Digital Equipment Corp., Hudson, MA, USA
fYear :
34608
Firstpage :
793
Lastpage :
801
Abstract :
Accuracy and precision are desirable properties of any test process. Understanding test process capability can help ensure that high speed microprocessors are binned at their proper speed. This paper discusses a practical example of how a designed experiment was used to determine the test process speed sorting error of measurement of the Alpha AXP, the industry´s fastest microprocessor, tested at Digital Equipment Corporation´s Hudson, MA manufacturing site. Knowing error of measurement allowed effective guardbands to be established to guarantee specified performance in the context of the supplier´s and consumer´s risks. A series of test process improvements resulted from the follow-up work suggested by the experiment
Keywords :
computer testing; error analysis; integrated circuit testing; measurement errors; very high speed integrated circuits; Digital Equipment Corporation; MA manufacturing site; high speed microprocessor test; industry´s fastest microprocessor; measurement error calculation; sorting error; test process; test process speed; Circuit testing; Electronics industry; Integrated circuit reliability; Manufacturing industries; Manufacturing processes; Microprocessors; Mining industry; Pulp manufacturing; Sorting; Velocity measurement;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Test Conference, 1994. Proceedings., International
Conference_Location :
Washington, DC
ISSN :
1089-3539
Print_ISBN :
0-7803-2103-0
Type :
conf
DOI :
10.1109/TEST.1994.528026
Filename :
528026
Link To Document :
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