• DocumentCode
    1697707
  • Title

    1149.1 scan control transport levels

  • Author

    Gage, Robert

  • Author_Institution
    Sequent Comput. Syst., Beaverton, OR, USA
  • fYear
    34608
  • Firstpage
    1022
  • Abstract
    1149.1 scan constitutes the most general standard of electronic hardware test control available today. Delivery of an 1149.1 scan service from maintenance processors to system components constitutes a universal challenge to systems designers, and a major opportunity for venders in the chip and scan software business. A largely neglected level of scan transport may rapidly become important to system designers. Offerings in the scan distribution arena can be separated into a number of classes, which can be seen to have a certain hierarchy. In the middle of all of these services is a scan control chip. It is driven by a microprocessor and emits a serial scan string. The author describes the four levels of transport
  • Keywords
    IEEE standards; automatic test equipment; boundary scan testing; peripheral interfaces; system buses; IEEE 1149.1 scan control transport levels; Mux mechanism; distributed scan control; electronic hardware test control; maintenance processors; packetised bus protocols; scan distribution; scan transport; system components; Clocks; Control systems; Electronic equipment testing; Hardware; Microprocessors; Silicon carbide; Software maintenance; Switches; System testing; Transport protocols;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference, 1994. Proceedings., International
  • Conference_Location
    Washington, DC
  • ISSN
    1089-3539
  • Print_ISBN
    0-7803-2103-0
  • Type

    conf

  • DOI
    10.1109/TEST.1994.528056
  • Filename
    528056