DocumentCode
1697707
Title
1149.1 scan control transport levels
Author
Gage, Robert
Author_Institution
Sequent Comput. Syst., Beaverton, OR, USA
fYear
34608
Firstpage
1022
Abstract
1149.1 scan constitutes the most general standard of electronic hardware test control available today. Delivery of an 1149.1 scan service from maintenance processors to system components constitutes a universal challenge to systems designers, and a major opportunity for venders in the chip and scan software business. A largely neglected level of scan transport may rapidly become important to system designers. Offerings in the scan distribution arena can be separated into a number of classes, which can be seen to have a certain hierarchy. In the middle of all of these services is a scan control chip. It is driven by a microprocessor and emits a serial scan string. The author describes the four levels of transport
Keywords
IEEE standards; automatic test equipment; boundary scan testing; peripheral interfaces; system buses; IEEE 1149.1 scan control transport levels; Mux mechanism; distributed scan control; electronic hardware test control; maintenance processors; packetised bus protocols; scan distribution; scan transport; system components; Clocks; Control systems; Electronic equipment testing; Hardware; Microprocessors; Silicon carbide; Software maintenance; Switches; System testing; Transport protocols;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 1994. Proceedings., International
Conference_Location
Washington, DC
ISSN
1089-3539
Print_ISBN
0-7803-2103-0
Type
conf
DOI
10.1109/TEST.1994.528056
Filename
528056
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