DocumentCode :
1698057
Title :
Three-dimensional very thin stacked packaging technology for SiP
Author :
Yano, Yuji ; Sugiyama, Takuya ; Ishihara, Seiji ; Fukui, Yasuki ; Juso, Hiroyuki ; Miyata, Koji ; Sota, Yoshiki ; Fujita, Kazuya
Author_Institution :
Dept. Packaging Dev., Sharp Corp., Tenri, Japan
fYear :
2002
fDate :
6/24/1905 12:00:00 AM
Firstpage :
1329
Lastpage :
1334
Abstract :
In order to achieve the greater compactness, lightness, high- and multi-functionality required of mobile equipment and other electronic devices, we have developed 3D packaging technology which enables free stacking, at the package level, of ultra-thin CSP (which contain 2 or 1 LSI chip(s)). By stacking at the package level, there are no yield problems, and it is easy to perform independent electrical testing, so it is possible to achieve multi-level stacking while freely combining different kinds of LSI chips like memory or ASIC. By making chips and resin molding thinner, lowering wire loops and optimizing the package structure, we achieved higher package density: a single unit (2 chips) package height of 0.55 mmMax., 2 layers (4 chips) with a unit package height of 1.0 mmMax., and 3 layers (6 chips) with a unit package height of 1.5 mmMax. This technology makes it possible to offer ultra-compact systems-in-package (logic + memory) and high-capacity composite memories.
Keywords :
chip scale packaging; integrated circuit interconnections; integrated circuit testing; large scale integration; moulding; multichip modules; 0.55 mm; 1 mm; 1.5 mm; 3D packaging technology; 3D very thin stacked packaging technology; ASIC; LSI chips; SiP; compactness; electronic devices; free package level stacking; high-capacity composite memories; independent electrical testing; memory chips; mobile equipment; multi-functionality; multi-level stacking; package density; package height; package structure; resin molding; ultra-compact logic/memory systems-in-package; ultra-thin CSP stacking; wire loops; Application specific integrated circuits; Chip scale packaging; Electronics packaging; Large scale integration; Packaging machines; Performance evaluation; Resins; Stacking; Testing; Wire;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 2002. Proceedings. 52nd
ISSN :
0569-5503
Print_ISBN :
0-7803-7430-4
Type :
conf
DOI :
10.1109/ECTC.2002.1008278
Filename :
1008278
Link To Document :
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