• DocumentCode
    1698529
  • Title

    Filling the via hole of IC by VPES (Vacuum Printing Encapsulation Systems) for stacked chip (3D packaging)

  • Author

    Okuno, Atsushi ; Fujita, Noriko

  • Author_Institution
    Sanyu Rec. Co. Ltd., Osaka, Japan
  • fYear
    2002
  • fDate
    6/24/1905 12:00:00 AM
  • Firstpage
    1444
  • Lastpage
    1448
  • Abstract
    The most important process for the development of 3-dimensional packaging, especially wafer stacking, is studied in this paper. This is the process of via hole filling; via holes require filling with conductive paste for connection or non-conductive paste for reliability. VPES (Vacuum Printing Encapsulation System) is useful for the process of filling the paste in small via holes. This process is also suitable for filling via holes of a functional substrate and glass. Various types of paste (both of conductive paste and nonconductive paste) were studied to aid the selection of paste for the requirement of packaging. It was most difficult and important that printing conditions (printing times, vacuum condition etc.) were different for each paste. Printing conditions for each paste were confirmed and the mechanisms for filling of via hole by VPES were identified. The printing condition depends on the structure of via hole (design, aspect ratio, diameter and depth etc.), also the properties of the filling paste (viscosity and thixotropic index etc.).
  • Keywords
    encapsulation; integrated circuit manufacture; integrated circuit packaging; microassembling; printing; 3D packaging; IC via holes; conductive paste; filling paste; nonconductive paste; printing conditions; stacked chips; three-dimensional packaging; vacuum printing encapsulation system; via hole filling; wafer stacking; Chip scale packaging; Electronics packaging; Encapsulation; Filling; Light emitting diodes; Printing; Smart cards; Stacking; Vacuum systems; Wire;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference, 2002. Proceedings. 52nd
  • ISSN
    0569-5503
  • Print_ISBN
    0-7803-7430-4
  • Type

    conf

  • DOI
    10.1109/ECTC.2002.1008296
  • Filename
    1008296