Title :
A systems approach to portable testers total test system integration (T2SI)
Author :
Rysanek, Philip ; Dilger, George ; Carr, William
Author_Institution :
Sanders Associates, Nashua, NH, USA
Abstract :
A type of systems architecture that will produce the portable automatic test equipment (ATE) to meet the growing demand for true portability and versatility is discussed. An approach to resolving the standardization issued by providing a portable test system that is generic, reprogrammable, and reconfigurable in architecture, which will allow new technology insertion regardless of the test system application, is presented. The system architecture discussed is a total test system integration or T2SI. The benefits of using a systems approach solution for portable ATE include lower life-cycle costs and shorter systems development for test applications
Keywords :
automatic test equipment; computer architecture; standardisation; systems engineering; ATE; life-cycle costs; portable automatic test equipment; standardization; Aerospace electronics; Aircraft; Costs; Displays; Electronic equipment testing; Life testing; Maintenance; Plugs; Standardization; System testing;
Conference_Titel :
AUTOTESTCON '88. IEEE International Automatic Testing Conference, Futuretest. Symposium Proceedings
Conference_Location :
Minneapolis, MN
DOI :
10.1109/AUTEST.1988.9594