DocumentCode :
1700751
Title :
Control systems for the nanolithography process
Author :
Schaper, Charles D. ; El-Awady, Khalid ; Tay, Arthur ; Kailath, Thomas
Author_Institution :
Inf. Syst. Lab., Stanford Univ., CA, USA
Volume :
4
fYear :
1999
fDate :
6/21/1905 12:00:00 AM
Firstpage :
4173
Abstract :
The lithography process is the critical step in the fabrication of nanostructures for integrated circuit manufacturing. In this paper, a summary is presented of several projects applying control and signal processing techniques to lithography. We begin with a discussion of areas in the optical exposure process where systems techniques make a significant difference. These areas include the optical mask preparation step where fast simulation methods and computational algorithms are used for mask design. Critical systems areas for next generation lithography are noted including nanopositioning by precision control of flexure systems and alignment by signal processing of laser interferometry strategies. A case study is then presented of temperature control for the postexposure bake step of sensitive chemically amplified photoresists used in deep-UV lithography
Keywords :
integrated circuit manufacture; light interferometry; micropositioning; nanotechnology; process control; temperature control; ultraviolet lithography; IC manufacturing; chemically amplified photoresists; computational algorithms; control systems; deep-UV lithography; integrated circuit manufacturing; laser interferometry strategies; nanolithography process; nanopositioning; nanostructure fabrication; optical exposure process; optical mask preparation; postexposure bake step; precision flexure system control; temperature control; ultraviolet lithography process; Control systems; Integrated circuit manufacture; Lithography; Nanolithography; Nanostructures; Optical device fabrication; Optical interferometry; Optical sensors; Optical signal processing; Signal processing algorithms;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Decision and Control, 1999. Proceedings of the 38th IEEE Conference on
Conference_Location :
Phoenix, AZ
ISSN :
0191-2216
Print_ISBN :
0-7803-5250-5
Type :
conf
DOI :
10.1109/CDC.1999.828016
Filename :
828016
Link To Document :
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