Title :
IEE Colloquium on `Mixed Signal VLSI Test´ (Digest No.1993/240)
fDate :
12/13/1993 12:00:00 AM
Abstract :
The following topics were dealt with: board level test; test methodologies; testability analysis; BIST; and mixed-mode simulation
Keywords :
VLSI; built-in self test; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; printed circuit testing; BIST; IC testing; PC testing; VLSI; board level test; mixed-mode simulation; test methodologies; testability analysis;
Conference_Titel :
Mixed Signal VLSI Test, IEE Colloquium on
Conference_Location :
London
