• DocumentCode
    170182
  • Title

    Automatic correction of certain design errors using mutation technique

  • Author

    Behnam, Payman ; Alizadeh, Behrooz ; Navabi, Zainalabedin

  • Author_Institution
    Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran
  • fYear
    2014
  • fDate
    26-30 May 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    In this paper, we introduce a new technique that makes use of satisfiability (SAT) based debugging techniques along with a mutation-based technique to correct certain design errors in digital designs automatically. The experimental results demonstrate that our proposed method enables us to locate and correct multiple bugs by targeting gate replacements and wire exchanging within reasonable run-time and memory usage for several designs.
  • Keywords
    computability; logic design; program debugging; SAT based debugging techniques; bug correction; bug location; design error correction; digital designs; gate replacements; mutation-based technique; satisfiability; wire exchange; Computer bugs; Debugging; Educational institutions; Logic gates; Memory management; Polynomials; Wires; correction; debugging; mutation; satisfiability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Symposium (ETS), 2014 19th IEEE European
  • Conference_Location
    Paderborn
  • Type

    conf

  • DOI
    10.1109/ETS.2014.6847833
  • Filename
    6847833