An off-line MDSI interconnect BIST incorporated in BS 1149.1

Author

Mohammadi, M. ; Sadeghi-Kohan, Somayeh ; Masoumi, Nasser ; Navabi, Zainalabedin

Author_Institution

Sch. of Electr. & Comput. Eng., Univ. of Tehran, Tehran, Iran

fYear

2014

fDate

26-30 May 2014

Firstpage

1

Lastpage

2

Abstract

This paper presents an off-line interconnect test methodology that implements the MDSI (Maximal Dominant Signal Integrity) crosstalk fault model. The test methodology consists of MDSI test pattern generators and response analyzers that are incorporated into the IEEE BS 1149.1 Standard on the two sides of an interconnect. This work is the first in implementing MDSI hardware structure. Our method is compared with hardware structures implementing MA interconnect tests.

Keywords

built-in self test; crosstalk; integrated circuit interconnections; integrated circuit testing; IEEE BS 1149.1 standard; MA interconnection testing; MDSI hardware structure; MDSI test pattern generator; crosstalk fault model; maximal dominant signal integrity; offline MDSI interconnection BIST; offline interconnection test methodology; response analyzer; Circuit faults; Computer architecture; Crosstalk; Hardware; Integrated circuit interconnections; Standards; Testing; IEEE 1149.1; MDSI modeling; crosstalk fault;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Symposium (ETS), 2014 19th IEEE European

Conference_Location

Paderborn

Type

conf

DOI

10.1109/ETS.2014.6847847

Filename

6847847