DocumentCode
17023
Title
Effective Low-Temperature Flux Pinning by Au Ion Irradiation in HTS Coated Conductors
Author
Strickland, Nicholas M. ; Wimbush, Stuart C. ; Kennedy, J.V. ; Ridgway, M.C. ; Talantsev, E.F. ; Long, Nicholas J.
Author_Institution
Robinson Res. Inst., Victoria Univ. of Wellington, Wellington, New Zealand
Volume
25
Issue
3
fYear
2015
fDate
Jun-15
Firstpage
1
Lastpage
5
Abstract
We report the effects of heavy-ion irradiation on critical currents in (Y,Dy)Ba2Cu3O7-δ coated conductors made by a commercial metal organic deposition process. Irradiation with 185 MeV Au ions is investigated and contrasted with previous results on 74 MeV Ag ions. The change in critical current (Ic) is reported as a function of temperature (30-77 K), magnetic field (0-7 T) and magnetic-field angle (full angle dependence). Significant improvements are seen particularly at 30-40 K where Ic can be enhanced over a wide angular range and the minimum of Ic(θ) has been enhanced by up to 60%. This contrasts with the data for the commonly utilized regime of 77 K, 1 T where the Ic enhancements are small or limited to a narrow angular range. This data also serves to illustrate the need to measure Ic in all of the temperature and field regimes of technical interest and to measure the complete field-angular dependence Ic(θ).
Keywords
MOCVD; barium compounds; critical currents; dysprosium compounds; flux pinning; high-temperature superconductors; ion beam effects; yttrium compounds; (YDy)Ba2Cu3O7-δ; Au ions; HTS coated conductors; critical currents; effective low-temperature flux pinning; electron volt energy 185 MeV; field-angular dependence; heavy-ion irradiation effects; magnetic-field angle; metal organic deposition process; temperature 30 K to 77 K; Current measurement; Gold; Integrated circuits; Ions; Magnetic field measurement; Radiation effects; Temperature measurement; Angular anisotropy; YBCO; angular anisotropy; coated conductor; critical current; flux pinning; ion irradiation;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2014.2366079
Filename
6939646
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