Title :
Angle sensitive pixels in CMOS for lensless 3D imaging
Author :
Wang, Albert ; Gill, Patrick ; Molnar, Alyosha
Author_Institution :
Sch. of Electr. & Comput. Eng., Cornell Univ., Ithaca, NY, USA
Abstract :
We present a pixel-scale CMOS sensor for near-field, lensless 3D imaging. This angle-sensitive pixel (ASP) uses local, stacked diffraction gratings over a photodiode to discriminate the incident angle of incoming light. The ASPs, measuring 20 mum wide and 40 mum long, have been built in an unmodified 130 nm CMOS process. Metal wiring layers provide the required gratings, while intrinsic pn-junctions act as photodiodes. We present operating principles and design considerations of the ASP, as well as results demonstrating desired angle sensitivity. Arrays of ASPs enable lensless microscale imaging that reconstructs the 3-dimensional structure of light sources.
Keywords :
CMOS image sensors; diffraction gratings; image reconstruction; photodiodes; ASP array; angle-sensitive pixel design; image reconstruction; lensless microscale imaging; light source three-dimensional structure; metal wiring layers; photodiodes; pixel-scale CMOS image sensor; size 130 nm; size 20 nm; size 40 nm; stacked diffraction grating; Application specific processors; CMOS image sensors; CMOS process; Diffraction gratings; Image reconstruction; Light sources; Optical arrays; Photodiodes; Pixel; Wiring;
Conference_Titel :
Custom Integrated Circuits Conference, 2009. CICC '09. IEEE
Conference_Location :
San Jose, CA
Print_ISBN :
978-1-4244-4071-9
Electronic_ISBN :
978-1-4244-4073-3
DOI :
10.1109/CICC.2009.5280840