Title :
Electro-Optic Sampling Of High-speed III-V Devices And ICS
Author_Institution :
Amoco Research Center
Keywords :
Electrooptic devices; HEMTs; High speed optical techniques; III-V semiconductor materials; MODFETs; Optical pulses; Optical sensors; Pulse measurements; Sampling methods; Ultrafast optics;
Conference_Titel :
High Speed Semiconductor Devices and Circuits, 1987. Proceedings., IEEE/Cornell Conference on Advanced Concepts in
Conference_Location :
Ithaca, NY, USA
DOI :
10.1109/CORNEL.1987.721210
