ERP qualification exploiting waveform, spectral and time-frequency infomax

The present contribution briefly introduces an event related potential (ERP) detector. The specified detector includes three kinds of features of ERP. They are the ERP waveform feature, ERP spectral feature and ERP time-frequency feature respectively. According to these characteristics, two parameters are defined to reflect the timing feature of ERP. The mismatch negativity (MMN) is taken as the example to design an exact qualification detector. The experiment validates that the computer can automatically detect the raw trace to reflect the quality of the dataset, qualify the filtered trace to test whether the artifacts have been filtered out, and select the ERP-like component to reject artifacts. This can avoid the mistakes taken by the prior knowledge of the scalp map characteristic criteria. Furthermore, the qualification detector can give the response to users for the further experiment.