Title :
IEE Colloquium on `Testing-the Gordian Knot of VLSI Design´ (Digest No.1993/131)
fDate :
5/28/1993 12:00:00 AM
Abstract :
The following topics were dealt with: board level testing; BIST; boundary scan testing; ASICs; VHDL; analogue circuits; mixed-signal modules; and Petri net applications
Keywords :
VLSI; application specific integrated circuits; automatic testing; boundary scan testing; built-in self test; integrated circuit testing; ASICs; BIST; Petri net applications; VHDL; analogue circuits; board level testing; boundary scan testing; mixed-signal modules;
Conference_Titel :
Testing-the Gordian Knot of VLSI Design, IEE Colloquium on
Conference_Location :
London
