Title :
Analytical Envelope Correlation and Outage Probability of Maximal-Ratio Combined Rician Fading Channels
Author :
Wang, Zhuwei ; Hu, Yanfen ; Chen, Xubin ; Zhang, Xin ; Yang, Dacheng
Author_Institution :
Beijing Univ. of Posts & Telecommun., Beijing
Abstract :
In this paper, with minor approximation, we provide analytical expressions in a close form for the envelope correlation coefficient (ECC) and outage probability of the maximal ratio combining (MRC) output in correlated Rayleigh and Rician fading environments. Moreover, we find a simple relationship between ECC and the outage probability, which indicates that ECC can be used to predict system performance such as outage probability quantitatively. Besides, it has been demonstrated by Monte Carlo simulation that our analysis are matched with the numerical results excellently.
Keywords :
Rayleigh channels; Rician channels; correlation methods; probability; Monte Carlo simulation; Rayleigh fading environments; Rician fading environments; envelope correlation coefficient; maximal ratio combining output; outage probability; Bit error rate; Closed-form solution; Diversity reception; Fading; Numerical simulation; Rayleigh channels; Rician channels; Signal to noise ratio; System performance; Working environment noise;
Conference_Titel :
Vehicular Technology Conference, 2007. VTC-2007 Fall. 2007 IEEE 66th
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-0263-2
Electronic_ISBN :
1090-3038
DOI :
10.1109/VETECF.2007.202
