DocumentCode
1706131
Title
Foreword to the 12th IEEE DDECS symposium
fYear
2009
Abstract
Presents the welcome message from the conference proceedings.
Keywords
CMOS technology; Circuit testing; Computer industry; Conferences; Electronic circuits; Electronic equipment testing; Logic testing; Paper technology; System testing; Technical Councils;
fLanguage
English
Publisher
ieee
Conference_Titel
Design and Diagnostics of Electronic Circuits & Systems, 2009. DDECS '09. 12th International Symposium on
Conference_Location
Liberec
Print_ISBN
978-1-4244-3341-4
Type
conf
DOI
10.1109/DDECS.2009.5012081
Filename
5012081
Link To Document