• DocumentCode
    1707360
  • Title

    A 5.7mW/Gb/s 24-to-240Ω 1.6Gb/s thin-oxide DDR transmitter with 1.9-to-7.6V/ns clock-feathering slew-rate control in 22nm CMOS

  • Author

    Kossel, Marcel ; Menolfi, Christian ; Toifl, Thomas ; Francese, Pier Andrea ; Brandli, Matthias ; Buchmann, Peter ; Kull, Lukas ; Andersen, Toke Meyer ; Morf, Thomas

  • Author_Institution
    IBM, Rüschlikon, Switzerland
  • fYear
    2013
  • Firstpage
    310
  • Lastpage
    311
  • Abstract
    The signal integrity (SI) of double data rate (DDR) memory links is affected by signal reflections due to the multi-drop configuration of heavily loaded memory busses. Variable-impedance drivers, on-die termination (ODT), feed-forward equalization (FFE) and slew-rate (SR) control are typically implemented in DDR transmitters to address SI issues. In particular for multi-module, multi-rank configurations where speed throttling must be applied, SR control turns out to be most effective to combat reflections and crosstalk. Slewed signal edges reduce the spectral content above the bit rate frequency, whereas FFE dampens lower frequencies to compensate for channel loss, which may, however, be less of a problem at throttled data rates.
  • Keywords
    CMOS integrated circuits; crosstalk; driver circuits; random-access storage; system buses; CMOS; DDR memory link; FFE; ODT; SI; SR control; channel loss; clock-feathering slew-rate control; crosstalk; double data rate memory link; feed-forward equalization; loaded memory busses; multidrop configuration; multimodule configuration; multirank configuration; on-die termination; resistance 24 ohm to 240 ohm; signal integrity; signal reflection; spectral content reduction; thin-oxide DDR transmitter; variable-impedance driver; CMOS integrated circuits; Clocks; Delays; Generators; Impedance; Transmitters; Vectors;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid-State Circuits Conference Digest of Technical Papers (ISSCC), 2013 IEEE International
  • Conference_Location
    San Francisco, CA
  • ISSN
    0193-6530
  • Print_ISBN
    978-1-4673-4515-6
  • Type

    conf

  • DOI
    10.1109/ISSCC.2013.6487748
  • Filename
    6487748