DocumentCode :
1711901
Title :
Calibration methods for electric field probes and GTEM cells
Author :
Kordi, Behzad ; Lo Vetri, J. ; Bridges, Greg ; Jeffrey, Ian
Author_Institution :
Dept. of Electr. & Comput. Eng., Manitoba Univ., Winnipeg, Man., Canada
Volume :
3
fYear :
2004
Firstpage :
908
Abstract :
In this paper, two techniques are presented for in-situ calibration of an electric-field probe, in our case an asymptotic conical dipole. The first technique uses a parallel-plate probe as a reference, and measurements are performed using a spectrum analyzer. In the second technique, a network analyzer is employed to measure the two-port scattering parameters of the GTEM cell (apex of the cell) and the probe, which is installed on the floor of the cell. The antenna factor is extracted from the transmission coefficient. Measurements for both techniques are carried out in a GTEM cell. The effect of a nearby EUT on the antenna factor is investigated.
Keywords :
S-parameters; TEM cells; calibration; conical antennas; dipole antennas; electric field measurement; electromagnetic compatibility; probes; EMC; EUT; GTEM cells; antenna factor extraction; asymptotic conical dipole; electric field measurement; electric field probes; electromagnetic compatibility; in-situ calibration; network analyzer; parallel-plate probe; spectrum analyzer; two-port scattering parameters; Antenna measurements; Calibration; Capacitance; Dipole antennas; Electromagnetic fields; Electromagnetic measurements; Frequency; Magnetic field measurement; Probes; TEM cells;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
Type :
conf
DOI :
10.1109/ISEMC.2004.1349946
Filename :
1349946
Link To Document :
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