DocumentCode :
1711959
Title :
EMI proficiency testing program - conducted emission measurement
Author :
Rao, BSatish ; Varadan, Kowsalya
Author_Institution :
Dept. of Inf. Technol., Gov. of India, Bangalore, India
Volume :
3
fYear :
2004
Firstpage :
925
Abstract :
The testing and calibration laboratories complying to the new international standard ISO/IEC 17025 - ´General Requirements for the Competence of Testing and Calibration Laboratories´ are required to prove their competence through their satisfactory performance in the proficiency testing (PT) programs for accreditation by national/international accreditation bodies. These programs are normally organized by the accreditation body to monitor the performance of the laboratory and to ensure that the measurements carried out by the laboratories for the same parameter of a physical quantity have close agreement. The PT program in the EMI testing area on measurement of conducted emission was organized by the EMC laboratory at the Electronics Test and Development Centre, Bangalore. The program is funded and recognized by the National Accreditation Board for Testing and Calibration Laboratory (NABL). Ten laboratories participated in this program. A brief description of the methodology followed in organizing the program and the summary of the participants laboratory performance is brought out in this paper.
Keywords :
IEC standards; ISO standards; accreditation; electromagnetic compatibility; electromagnetic interference; Bangalore; EMC; EMI proficiency testing program; Electronics Test and Development Centre; General Requirements for the Competence of Testing and Calibration Laboratories; ISO/IEC 17025; NABL; National Accreditation Board for Testing and Calibration Laboratory; PT program; accreditation body; conducted emission measurement; international standard; Accreditation; Area measurement; Calibration; Condition monitoring; Electromagnetic compatibility; Electromagnetic interference; Electronic equipment testing; IEC standards; ISO standards; Laboratories;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
Type :
conf
DOI :
10.1109/ISEMC.2004.1349949
Filename :
1349949
Link To Document :
بازگشت