DocumentCode :
1712303
Title :
Comparison of via equivalent circuit model accuracy using quasi-static and full-wave approaches
Author :
Archambeault, Bruce ; Connor, Samuel ; Zhang, Jianmin ; Drewniak, James ; Lai, Mauro ; Orlandi, Antonio ; Antonini, Giulio ; Ruehli, Albert
Author_Institution :
IBM Corp., Research Triangle Park, NC, USA
Volume :
3
fYear :
2004
Firstpage :
994
Abstract :
The EMC and signal integrity impact of printed circuit board (PCB) trace discontinuities, such as vias, where the signal is transitioned from one layer to another in the PCB stackup, have become significant recently with the use of very high speed signals in today´s systems. If these discontinuities are ignored, significant distortion of the high speed signal can occur, and in many cases, cause data errors. A fast and accurate technique to include the effect of via discontinuities in the typical design process is needed to ensure this distortion is considered if significant. Therefore, a simple equivalent circuit for the via discontinuity is needed so that this equivalent circuit can be easily used in the normal signal integrity analysis tools. This paper demonstrates the effect on the equivalent circuit values as the distance between the signal via and the return-current via is increased. Also, the frequency range where a quasi-static based equivalent circuit is accurate or where a full-wave model is required is shown for the various distances between vias.
Keywords :
electromagnetic compatibility; equivalent circuits; printed circuit layout; EMC; PCB trace discontinuities; frequency range; full-wave approach; high speed signal; model accuracy; printed circuit board; quasi-static approach; signal integrity impact; via equivalent circuit model; Capacitors; Computational modeling; Distortion; Electromagnetic compatibility; Equivalent circuits; Inductance; Printed circuits; Process design; Signal analysis; Software tools;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on
Print_ISBN :
0-7803-8443-1
Type :
conf
DOI :
10.1109/ISEMC.2004.1349962
Filename :
1349962
Link To Document :
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