Optically scanning electric field probe system

Author

Suzuki, Eiji ; Arakawa, Satoru ; Ota, Huoyasu ; Arai, Ken Ichi ; Sato, Risaburo

Author_Institution

Sendai EMC Res. Center, Nat. Inst. of Inf. & Commun. Technol., Sendai, Japan

Volume

1

fYear

2004

Firstpage

182

Abstract

We present an optically scanning electric field probe system designed to provide high-speed measurements of electric field distributions near PCB or LSI chips with high spatial resolution up to the gigahertz range. The optical probe system uses an electro-optic crystal and a scanned laser beam for high-speed measurements. The probe provides measurement speed of 0.1 seconds per point. We examined probe characteristics of frequency response, linearity, minimum detectable field strength, and spatial resolution up to 10 GHz.

Keywords

electric field measurement; electro-optical devices; measurement by laser beam; optical scanners; optical sensors; probes; 0 to 10 GHz; 0.1 s; LSI chips; PCB; electric field distribution measurements; electro-optic crystal; field strength; frequency response; linearity; optical probe; optically scanning electric field probe system; scanned laser beam; spatial resolution; Electric variables measurement; High speed optical techniques; Large scale integration; Laser beams; Lasers and electrooptics; Optical design; Probes; Semiconductor device measurement; Spatial resolution; Velocity measurement;

fLanguage

English

Publisher

ieee

Conference_Titel

Electromagnetic Compatibility, 2004. EMC 2004. 2004 InternationalSymposium on

Print_ISBN

0-7803-8443-1

Type

conf

DOI

10.1109/ISEMC.2004.1350022

Filename

1350022