Title :
A General Purpose Test Apparatus for High-Speed, High Resolution Analog to Digital Converters Based on IEEE Standard
Author :
Lei, Zhao ; Shubin, Liu ; Yusheng, Li ; Qi, An
Author_Institution :
Univ. of Sci. & Technol. of China, Hefei
Abstract :
Nowadays high-speed, high resolution ADCs (analog to digital converter) are employed in many fields, thus there exists an important task - how to test these ADCs, giving reliable results. This ADC test apparatus is based on the IEEE Std. It aims for the test of high speed, high resolution ADCs (16 bit at most, with the sample rate up to 166 MSPS and expandable) and the "general purpose" ability. This essay present the basic techniques of ADC testing and the skills used in this apparatus, meanwhile giving the real test results of a commercial ADC for the illustration of its performance.
Keywords :
IEEE standards; analogue-digital conversion; IEEE standard; analog to digital converters; general purpose test apparatus; high resolution ADC; high speed ADC; Algorithm design and analysis; Analog-digital conversion; Crosstalk; Data analysis; Electronic equipment testing; Instruments; Laboratories; Measurement standards; Signal resolution; Universal Serial Bus; IEEE Std.; SFDR; SNR; USB; nonlinearity;
Conference_Titel :
Electronic Measurement and Instruments, 2007. ICEMI '07. 8th International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-1-4244-1136-8
Electronic_ISBN :
978-1-4244-1136-8
DOI :
10.1109/ICEMI.2007.4350417
