On the modelling of SEU effects on spread spectrum wireless systems

The analysis of wireless networks performance in ionizing scenarios represents a crucial step in order to deploy wireless intra-satellite networks instead of the classical wired communications. This novel concept introduces important benefits in terms of weight reduction and versatility, however electronic components are vulnerable to ionizing radiation environments. This work proposes a methodology for studying the communication system performance considering the Single Event Effects (SEE) as the source of communication errors. A mixed simulation/emulation platform has been developed which allows obtaining the bit error rate (BER) and the frame error rate (FER) as well as the inherent system robustness analysis under radiation. From the obtained results, a single event upset (SEU) noise model has been derived, making possible a more agile system study under different conditions and configurations. Results obtained by both the platform and the noise model allow to analyse the best suitable hardening techniques as well as the kind of forward error correction scheme which fits better with the error distribution.