DocumentCode :
1719804
Title :
High temperature defect structure of Cd- and Te-rich CdTe
Author :
Grill, R. ; Franc, J. ; Höschl, P. ; Turkevych, I. ; Belas, E. ; Moravec, P. ; Fiederle, M. ; Benz, K.W.
Author_Institution :
Inst. of Phys., Charles Univ., Prague, Czech Republic
Volume :
4
fYear :
2001
fDate :
6/23/1905 12:00:00 AM
Firstpage :
2348
Lastpage :
2352
Abstract :
The quasichemical formalism is used to evaluate simultaneously high temperature (600-1000°C) in-situ conductivity and Hall effect measurements and tellurium atom fraction in CdTe along a three-phase curve. We show, that the electrical properties can be described only by two native defects-the cadmium interstitial being divalent donor and the cadmium vacancy as a divalent acceptor. Close to the three-phase line other native defects must be involved in the model to allow deviation from stoichiometry irrespective to the low density of electrically charged defects. A deep divalent donor TeCd having both levels near or below the midgap describes best all high temperature experimental data
Keywords :
Hall effect; II-VI semiconductors; cadmium alloys; electrical conductivity; interstitials; tellurium alloys; vacancies (crystal); 600 to 1000 degC; CdTe; Hall effect; Te atom fraction; deep divalent donor; electrical properties; high temperature conductivity; interstitial; quasichemical formalism; stoichiometry; vacancy; Atomic measurements; Cadmium; Conductivity measurement; Crystalline materials; Current measurement; Density measurement; Hall effect; Impurities; Tellurium; Temperature;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nuclear Science Symposium Conference Record, 2001 IEEE
Conference_Location :
San Diego, CA
ISSN :
1082-3654
Print_ISBN :
0-7803-7324-3
Type :
conf
DOI :
10.1109/NSSMIC.2001.1009293
Filename :
1009293
Link To Document :
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