• DocumentCode
    1719804
  • Title

    High temperature defect structure of Cd- and Te-rich CdTe

  • Author

    Grill, R. ; Franc, J. ; Höschl, P. ; Turkevych, I. ; Belas, E. ; Moravec, P. ; Fiederle, M. ; Benz, K.W.

  • Author_Institution
    Inst. of Phys., Charles Univ., Prague, Czech Republic
  • Volume
    4
  • fYear
    2001
  • fDate
    6/23/1905 12:00:00 AM
  • Firstpage
    2348
  • Lastpage
    2352
  • Abstract
    The quasichemical formalism is used to evaluate simultaneously high temperature (600-1000°C) in-situ conductivity and Hall effect measurements and tellurium atom fraction in CdTe along a three-phase curve. We show, that the electrical properties can be described only by two native defects-the cadmium interstitial being divalent donor and the cadmium vacancy as a divalent acceptor. Close to the three-phase line other native defects must be involved in the model to allow deviation from stoichiometry irrespective to the low density of electrically charged defects. A deep divalent donor TeCd having both levels near or below the midgap describes best all high temperature experimental data
  • Keywords
    Hall effect; II-VI semiconductors; cadmium alloys; electrical conductivity; interstitials; tellurium alloys; vacancies (crystal); 600 to 1000 degC; CdTe; Hall effect; Te atom fraction; deep divalent donor; electrical properties; high temperature conductivity; interstitial; quasichemical formalism; stoichiometry; vacancy; Atomic measurements; Cadmium; Conductivity measurement; Crystalline materials; Current measurement; Density measurement; Hall effect; Impurities; Tellurium; Temperature;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nuclear Science Symposium Conference Record, 2001 IEEE
  • Conference_Location
    San Diego, CA
  • ISSN
    1082-3654
  • Print_ISBN
    0-7803-7324-3
  • Type

    conf

  • DOI
    10.1109/NSSMIC.2001.1009293
  • Filename
    1009293