Title :
Recent radiation damage and single event effect results for candidate spacecraft electronics
Author :
O´Bryan, Martha V. ; LaBel, Kenneth A. ; Reed, Robert A. ; Ladbury, Ray L. ; Howard, James W., Jr. ; Buchner, Stephen P. ; Barth, Janet L. ; Kniffin, Scott D. ; Seidleck, Christina M. ; Marshal, C.J. ; Marshal, P.W. ; Kim, Hak S. ; Hawkins, Donald K. ; Ca
Author_Institution :
Raytheon Inf. Technol. & Sci. Services, Lanham, MD, USA
fDate :
6/23/1905 12:00:00 AM
Abstract :
We present data on the vulnerability of a variety of candidate spacecraft electronics to proton and heavy ion induced single event effects and proton-induced damage. Devices tested include optoelectronics, digital, analog, linear bipolar, hybrid devices, Analog-to-Digital Converters (ADCs), Digital-to-Analog Converters (DACs), and DC-DC converters, among others
Keywords :
ion beam effects; proton effects; space vehicle electronics; heavy ion irradiation; proton irradiation; radiation damage; single event effect; spacecraft electronics; Aerospace electronics; Cyclotrons; Laboratories; NASA; Protons; Single event upset; Space vehicles; Telephony; Test facilities; Testing;
Conference_Titel :
Radiation Effects Data Workshop, 2001 IEEE
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7199-2
DOI :
10.1109/REDW.2001.960455
