• DocumentCode
    172255
  • Title

    Experimental study of transients and electrical fields caused by lightning flashover in the uhvdc converter station

  • Author

    Xiao Zhang ; Jinliang He ; Zhanqing Yu ; Rong Zeng ; Chanxiao Li ; Yin Huang ; Wei Qiu

  • Author_Institution
    Dept. of Electr. Eng., Tsinghua Univ., Beijing, China
  • fYear
    2014
  • fDate
    11-18 Oct. 2014
  • Firstpage
    1491
  • Lastpage
    1495
  • Abstract
    When lightning strikes the DC transmission line and causes flashover, the transients propagating in the primary circuit and impulse electromagnetic field generated in the station might cause interference or even block fault of the UHVDC system. In this paper, artificial short-circuit (DC line to ground) experiments are conducted out on an operating ± 800 kV DC system at different distances to the converter station, to simulate the lightning fault process, meanwhile the transient voltages and currents as well as the electrical fields are measured by advanced sensors and high sampling rate devices at different points in the converter station. It´s the first time that such experiments are carried out on a ± 800 kV DC system, with a comprehensively study of both the circuit and filed lightning transient characteristics.
  • Keywords
    HVDC power convertors; earthing; flashover; lightning protection; power system transients; power transmission faults; substation protection; DC line-to-ground experiments; DC transmission line; UHVDC converter station; advanced sensors; artificial short-circuit experiments; even block fault; filed lightning transient characteristics; high-sampling rate devices; impulse electromagnetic field; lightning fault process; lightning flashover; transient currents; transient voltages; Inductors; Inverters; Poles and towers; Smoothing methods; Transient analysis; HVDC; artificial short circuit; electrical fields; lightning transient;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Lightning Protection (ICLP), 2014 International Conference o
  • Conference_Location
    Shanghai
  • Type

    conf

  • DOI
    10.1109/ICLP.2014.6973364
  • Filename
    6973364