• DocumentCode
    1722771
  • Title

    Aging characteristics of polymer lightning arrester by multi-stress accelerated aging test

  • Author

    Lee, J.B. ; Song, L.K. ; Kim, J.Y. ; Lee, B.S. ; Kwon, T.H.

  • Author_Institution
    Distribution Technol. Group, Korea Electr. Power Res. Inst., Daejeon, South Korea
  • Volume
    1
  • fYear
    2004
  • Firstpage
    371
  • Abstract
    Recently polymer arresters are being used widely, but we don´t have appropriate long term characteristic test methods. Therefore, we need to develop a special test facility to evaluate long term reliability of polymer arresters. Its polymeric housing can be degraded by environmental stress and the interface between housing and inner module can be affected by moisture absorption. This moisture absorption can cause leakage current and tracking in the interface. We developed a multi-stress accelerated ageing test facility to simulate field conditions including UV, temperature, humidity, voltage, salt fog and rain. In addition, we carried out field exposure test at the outdoor test yard and characteristic analysis of field operated specimens to evaluate the accelerating factor of this accelerated aging test.
  • Keywords
    ageing; arresters; environmental degradation; insulation testing; leakage currents; life testing; lightning protection; organic insulating materials; polymers; stress effects; surface discharges; ultraviolet radiation effects; UV irradiation; accelerating factor; environmental stress; field exposure test; field operated specimens; housing-inner module interface; leakage current; moisture absorption; multi-stress accelerated aging test; multistress accelerated ageing test facility; polymer lightning arrester aging characteristics; polymeric housing degradation; tracking; Accelerated aging; Arresters; Electromagnetic wave absorption; Life estimation; Lightning; Moisture; Polymers; Test facilities; Testing; Thermal degradation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
  • Print_ISBN
    0-7803-8348-6
  • Type

    conf

  • DOI
    10.1109/ICSD.2004.1350368
  • Filename
    1350368