Title :
Built-In Current Monitor for IDDQ Testing in CMOS 90 nm Technology
Author :
Beresinski, M.J. ; Borejko, T. ; Pleskacz, Witold A. ; Stopjaková, Viera
Author_Institution :
Inst. of Microelectron. & Optoelectron., Warsaw Univ. of Technol., Warsaw
Abstract :
In this paper, a built-in current (BIC) monitor for testing low-voltage digital CMOS circuits is presented. The monitor is designated for typical IDDQ testing as well as for characterization of supply current values for different test vectors. Voltage drop across the monitor during measurement and the switching phase are minimized. A wide range of currents is supported. Abilities and limitations of the BIC monitor were verified through simulations. Results of post layout simulations are presented as well. The design was implemented in UMC CMOS 90 nm technology.
Keywords :
CMOS digital integrated circuits; integrated circuit testing; current monitor; digital CMOS circuits; testing; CMOS logic circuits; CMOS technology; Circuit faults; Circuit simulation; Circuit testing; Current supplies; Logic testing; Microelectronics; Monitoring; Threshold voltage;
Conference_Titel :
Design and Diagnostics of Electronic Circuits and Systems, 2008. DDECS 2008. 11th IEEE Workshop on
Conference_Location :
Bratislava
Print_ISBN :
978-1-4244-2276-0
Electronic_ISBN :
978-1-4244-2277-7
DOI :
10.1109/DDECS.2008.4538797
