DocumentCode :
1726636
Title :
Automated high voltage cable inspection using X-ray images
Author :
Robinson, A.P. ; Lewin, P.L. ; Sutton, S.J. ; Swingler, S.G.
Author_Institution :
High Voltage Lab., Southampton Univ., UK
Volume :
2
fYear :
2004
Firstpage :
687
Abstract :
Manufacturing defects are more likely to be introduced into cable during the jointing processes, due to the manual nature of this procedure. These defects can reduce the working lifetime of the cable. It is possible to detect these defects using X-ray techniques and photographic film, however there are problems associated with this procedure. To remove these problems the photographic plate can be replaced by a CCD array coupled to a scintillating screen. To ensure that there is no loss in image quality a comparative test has been conducted to compare the images generated using both film and CCD technologies. This test involved generating images of three test pieces using both film and the CCD camera. The film images were then digitised using a scanner so that they could be digital processed. Two algorithms were then used to process these images, a statistical based algorithm and a Newtonian based algorithm. The results of processing these images are discussed and indicate the viability of an automated digital X-ray cable inspection system.
Keywords :
CCD image sensors; X-ray imaging; automatic optical inspection; cable jointing; failure analysis; image processing; power cables; power engineering computing; statistical analysis; CCD camera; Newtonian based algorithm; X-ray images; automated digital X-ray cable inspection system; automated high voltage cable inspection; defect manufacturing; film images; image generation; jointing processes; photographic film; photographic plate; scintillating screen; statistical based algorithm; Charge coupled devices; Image generation; Image quality; Inspection; Manufacturing processes; Testing; Voltage; X-ray detection; X-ray detectors; X-ray imaging;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Solid Dielectrics, 2004. ICSD 2004. Proceedings of the 2004 IEEE International Conference on
Print_ISBN :
0-7803-8348-6
Type :
conf
DOI :
10.1109/ICSD.2004.1350524
Filename :
1350524
Link To Document :
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