• DocumentCode
    1726809
  • Title

    A New Optimized 200V Low On-Resistance Power FLYMOSFET

  • Author

    Weber, Y. ; Morancho, F. ; Reynés, J.M. ; Stefanov, E.

  • Author_Institution
    LAAS, CNRS, Toulouse
  • fYear
    2008
  • Firstpage
    149
  • Lastpage
    152
  • Abstract
    Nowadays, the "on-resistance" reduction is key factor in the evolution of power devices, especially in power MOSFETs technology. In that way, innovating structures such as superjunction (SJ) [1] or floating islands (FI) [2, 3, 4] devices have been developed. Previously, a vertical N-channel FLYMOSFET, including one level of P buried layers called floating islands (introduced in the N-epitaxial region), has been successfully developed [5, 6]. In this paper, new design and process improvements provide for the first time a FLYMOSFET with two levels of FI exhibiting a low specific on-resistance (RON-S) of 4.5 mOmega.cm2 in 200 V breakdown voltage (BVdss) range which breaks the silicon limit [7]. Furthermore, a full physical and electrical characterization is presented, especially in dynamic configuration to evaluate FLYMOSFET\´s performances. Then a manufactured 200 V SJ product from another company is analyzed and compared to it. FLYMOSFET appears as a good alternative to 200 V SJ devices.
  • Keywords
    power MOSFET; FLYMOSFET; floating islands; power MOSFET; voltage 200 V; Design optimization; Electric variables measurement; MOSFETs; Performance evaluation; Power semiconductor devices; Process design; Shape measurement; Silicon; Synthetic aperture sonar; Uninterruptible power systems;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Power Semiconductor Devices and IC's, 2008. ISPSD '08. 20th International Symposium on
  • Conference_Location
    Orlando, FL
  • Print_ISBN
    978-1-4244-1532-8
  • Electronic_ISBN
    978-1-4244-1533-5
  • Type

    conf

  • DOI
    10.1109/ISPSD.2008.4538920
  • Filename
    4538920