DocumentCode :
1730759
Title :
Delamination prediction in lead frame packages using adhesion measurements and interfacial fracture modeling
Author :
Srinivasan, Venkat ; Miller, Mikel ; Gurrum, Siva ; Zhao, Jie-Hua ; Edwards, Darvin ; Murtuza, Masood
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
fYear :
2011
Firstpage :
1269
Lastpage :
1275
Abstract :
A combined adhesion characterization and fracture mechanics based modeling methodology has been developed to predict delamination in lead frame packages. This methodology allows experimental data from a simple adhesion test such as button shear test to be used along with the finite element model to ultimately predict whether a particular interface will fail in reliability testing. The methodology was validated using existing package reliability data across several package types, materials and package interfaces. In each case, the delamination prediction was compared to the actual occurrence of delamination post reliability testing. The validation showed that delamination could be predicted with 80-90% accuracy, depending on the interface and the temperature condition considered.
Keywords :
adhesion; delamination; electronics packaging; finite element analysis; fracture; reliability; testing; adhesion characterization; adhesion measurement; adhesion test; button shear test; delamination prediction; finite element model; fracture mechanics; interfacial fracture modeling; lead frame package; package reliability; reliability testing; Adhesives; Correlation; Delamination; Finite element methods; Lead; Materials; Reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location :
Lake Buena Vista, FL
ISSN :
0569-5503
Print_ISBN :
978-1-61284-497-8
Electronic_ISBN :
0569-5503
Type :
conf
DOI :
10.1109/ECTC.2011.5898674
Filename :
5898674
Link To Document :
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