DocumentCode :
1732779
Title :
Diagnosis of XLPE insulated cables aged under conditions of multiple stresses: thermoelectric and humidity
Author :
Silva, Da ; Ramirez, Elizabeth ; Rodriguez, Jorge ; Bermudez, Juan ; Ren, Juan ; Ferrez, A. ; Davila, S.
Author_Institution :
Dept. of Conversion & Transp. of Energy, Simon Bolivar Univ., Caracas, Venezuela
Volume :
1
fYear :
1998
Firstpage :
117
Abstract :
This work summarizes the main results obtained when subjecting 15 kV XLPE insulated cables to degradation, under conditions of multiple stresses (temperature, voltage, impulses of voltage and humidity). The effect of the degradation was evaluated by analyzing the modifications that appear in the main electric properties and microscopic observations. The results show that the presence of humidity and the application of impulses constitute factors highly degrading while certain thermal cycles may collaborate in the recovery of the properties of the insulation given that the material presents certain regenerative characteristics associated with its own structure and morphology, mainly in the initial stages of the process. Additionally, it was verified that the presence of humidity in the exterior of the cables constitutes the necessary input for the development of water trees and that it leads, in a parallel way, to a reduction of the deformations in the insulation that appear by thermal expansion
Keywords :
XLPE insulation; ageing; dielectric losses; environmental degradation; environmental testing; humidity; impulse testing; insulation testing; partial discharges; power cable insulation; power cable testing; thermal expansion; trees (electrical); underground cables; 15 kV; XLPE insulated cable degradation; dielectric losses; electric properties; humidity; insulation deformation; microscopic observations; multiple stress conditions; partial discharges; recovery; regenerative characteristics; thermal cycles; thermal expansion; thermoelectric stress; underground cables; voltage impulses; water trees; Aging; Cable insulation; Cables; Humidity; Microscopy; Temperature; Thermal degradation; Thermal factors; Thermal stresses; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electrical Insulation, 1998. Conference Record of the 1998 IEEE International Symposium on
Conference_Location :
Arlington, VA
ISSN :
1089-084X
Print_ISBN :
0-7803-4927-X
Type :
conf
DOI :
10.1109/ELINSL.1998.704677
Filename :
704677
Link To Document :
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