Proceedings International Test Conference 2008

fYear

2008

Abstract

The following topics are dealt with: system-level microprocessor online test; embedded memory diagnosis and characterization; high-speed I/O testing; defect avoidance in microprocessors; cost analysis framework-for-multicore systems; delay testing; chip performance maximization; power-aware DFT methods; board interconnect test technology; complex SOCs reliability; power supply noise analysis; ATE instrumentation design; small-delay fault ATPG embedded memory test; RF testing; test standards; data converter testing; advanced industrial practices; and analog test technology.

Keywords

analogue integrated circuits; automatic test pattern generation; embedded systems; integrated circuit interconnections; integrated circuit reliability; integrated circuit testing; integrated memory circuits; microprocessor chips; system-on-chip; ATE instrumentation design; ATPG; RF testing; advanced industrial practices; analog test technology; board interconnect test technology; chip performance maximization; complex SOC reliability; data converter testing; delay testing; embedded memory characterization; embedded memory diagnosis; high-speed I/O testing; microprocessor defect avoidance; multicore system cost analysis framework; power supply noise analysis; power-aware DFT methods; small-delay fault ATPG embedded memory test; system-level microprocessor online test; test standards;

fLanguage

English

Publisher

ieee

Conference_Titel

Test Conference, 2008. ITC 2008. IEEE International

Conference_Location

Santa Clara, CA

ISSN

1089-3539

Print_ISBN

978-1-4244-2402-3

Electronic_ISBN

1089-3539

Type

conf

DOI

10.1109/TEST.2008.4700529

Filename

4700529