Title :
Test Access Mechanism for Multiple Identical Cores
Author :
Giles, Grady ; Wang, Jing ; Sehgal, Anuja ; Balakrishnan, Kedarnath J. ; Wingfield, James
Author_Institution :
Adv. Micro Devices Austin, Sunnyvale, CA
Abstract :
A new test access mechanism (TAM) for multiple identical embedded cores is proposed. It exploits the identical nature of the cores and modular pipelined circuitry to provide scalable and flexible capabilities to make tradeoffs between test time and diagnosis over the manufacturing maturity cycle from low-yield initial production to high-yield, high-volume production. The test throughput gains of various configurations of this TAM are analyzed. Forward and reverse protocol translations for core patterns applied with this TAM are described.
Keywords :
embedded systems; multiprocessing systems; pipeline processing; forward protocol translations; modular pipelined circuitry; multiple identical embedded cores; reverse protocol translations; test access mechanism; test time; Automatic test pattern generation; Broadcasting; Circuit testing; Fault detection; Flexible manufacturing systems; Microprocessors; Pipeline processing; Production; Throughput; Vehicles;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700553
