DocumentCode :
1733653
Title :
Application of multi-signal modeling theory to testability analysis for complex electronic system
Author :
Liu, Haisong ; Wu, Jiechang ; Chen, Guojun
Author_Institution :
Dept. of Mech. Eng., Naval Univ. of Eng., Wuhan, China
Volume :
2
fYear :
2011
Firstpage :
755
Lastpage :
758
Abstract :
It is important to consider the testability problem for electronic equipment design due to the increased complication of system function and structure. Multi-signal model is akin to overlaying a set of single-signal dependency models on the structural model, which combines advantages of structure model and dependency model. Thus multi-signal modeling method is adopted to describe dependency relationship and calculate testability parameters in this paper. The testability analysis process is illustrated by a practical example of centralized engine room control system. The experimental results indicate that the multi-signal modeling based method is simple, visual and effective for testability analysis of complex electronic system.
Keywords :
electronic equipment testing; signal processing equipment; centralized engine room control system; complex electronic system; electronic equipment design; multisignal modeling theory; single-signal dependency models; structural model; testability analysis; Actuators; Analytical models; Silicon; complex electronic system; multi-signal model; testability analysis;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Science and Network Technology (ICCSNT), 2011 International Conference on
Conference_Location :
Harbin
Print_ISBN :
978-1-4577-1586-0
Type :
conf
DOI :
10.1109/ICCSNT.2011.6182074
Filename :
6182074
Link To Document :
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