DocumentCode :
1734380
Title :
Investigation of High Frequency Performance for Schottky-Barrier p-MOSFET
Author :
Valentin, Raphaël ; Dubois, Emmanuel ; Raskin, Jean-Pierre ; Dambrine, Gilles ; Larrieu, Guilhem ; Breil, Nicolas ; Danneville, Francois
Author_Institution :
IEMN, Villeneuve d´´Ascq
fYear :
2007
Firstpage :
32
Lastpage :
35
Abstract :
Schottky-barrier source/drain (S/D) MOSFETs (SB-MOS) have recently demonstrated leading edge high frequency (HF) performance, featuring a 280 GHz current gain cut-off frequency fT at 30 nm of gate length. Although this figure represents the best ever recorded fT for a p-MOSFET, little effort has been produced, so far, to analyze key small signal elements (SSE) such as the transconductance G m and the total input capacitance Cgg that directly impact fT. This work demonstrates that the loss of transconductance related to the Schottky barrier (SB) is counterbalanced by a reduction of the total gate capacitance
Keywords :
MOSFET; Schottky diodes; millimetre wave field effect transistors; Schottky-barrier p-MOSFET; Schottky-barrier source/drain MOSFET; small signal elements; total gate capacitance; transconductance; Capacitance; Cutoff frequency; Dielectric substrates; Doping; Hafnium; MOSFET circuits; Performance analysis; Schottky barriers; Signal analysis; Transconductance; High Frequency; MOSFETs; SOI; Schottky Barrier; silicon; simulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on
Conference_Location :
Long Beach, CA
Print_ISBN :
0-7803-9765-7
Electronic_ISBN :
0-7803-9765-7
Type :
conf
DOI :
10.1109/SMIC.2007.322762
Filename :
4117318
Link To Document :
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