Title :
RF characterization and parameter extraction for CMOS device models
Author :
Pekarik, John J. ; Jagannathan, Basanth ; Pan, Li-hong ; Wang, Jing ; Groves, Robert ; Li, Hongmei ; Tian, Xiaowei ; Greenberg, David R. ; Jin, Zhenrong ; Wagner, Lawrence
Author_Institution :
IBM Semicond. Res. & Dev. Center, Essex Junction, VT
Abstract :
We describe the measurement and extraction of high-frequency compact model parameters of MOSFETs for use in design of RF applications
Keywords :
CMOS integrated circuits; MOSFET; parameter estimation; semiconductor device models; CMOS device models; MOSFET; RF characterization; compact model parameters; parameter extraction; CMOS technology; Contact resistance; Electrical resistance measurement; MOSFETs; Parameter extraction; Radio frequency; Research and development; Semiconductor device modeling; Transceivers; Wiring; RFCMOS; characterization; compact models; parasitics;
Conference_Titel :
Silicon Monolithic Integrated Circuits in RF Systems, 2007 Topical Meeting on
Conference_Location :
Long Beach, CA
Print_ISBN :
0-7803-9765-7
Electronic_ISBN :
0-7803-9765-7
DOI :
10.1109/SMIC.2007.322763
