• DocumentCode
    1734472
  • Title

    Air cavity low-loss transmission lines for high speed serial link applications

  • Author

    Chen, Jikai ; Hu, Yan ; Chen, Yu-Chun ; Saha, Rajarshi ; Bashirullah, Rizwan ; Kohl, Paul

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of Florida, Gainesville, FL, USA
  • fYear
    2011
  • Firstpage
    2146
  • Lastpage
    2151
  • Abstract
    This paper reports on the design, optimization, processing and measurement of an air-cavity transmission line structure on FR-4 boards for high-speed chip-to-chip links. The proposed structure has air as the insulating material, thereby minimizing the dielectric loss. Full-wave electromagnetic simulation is used to predict the performance of the proposed air-cavity structure. Compared to conventional transmission lines on an FR4 substrate, the effective dielectric constant is reduced by 25% from 2.75 to 2.07, and the dielectric loss is reduced by 26% from 0.48 dB/cm (1.22 dB/inch) to 0.35 dB/cm (0.9 dB/inch) at 20 GHz. Simulation also shows that conductor surface roughness contributes significant loss, which is confirmed by the measurement results. An active low power electrical link demonstration is also reported herein. The transmitter (TX) utilizes a 1-tap feed-forward-equalization (FFE) for pre-cursor cancellation and the receiver (RX) a 1-tap decision-feedback-equalization (DFE) for post-cursor cancellation. The TX and RX frontends implement a current-sharing scheme to reduce the overall link power consumption. The circuitry and interconnect were co-designed to achieve 6.25 Gb/s at ~0.6 mW/Gb/s (or 0.6 pJ/bits) in 0.13 μm 1.2V CMOS process.
  • Keywords
    CMOS integrated circuits; decision feedback equalisers; dielectric losses; permittivity; radio receivers; radio transmitters; surface roughness; transmission line theory; CMOS process; FR-4 boards; active low power electrical link; air-cavity structure; air-cavity transmission line structure; decision feedback equalization; dielectric constant; dielectric loss; electromagnetic simulation; feedforward equalization; high speed serial link; high-speed chip-to-chip links; insulating material; low-loss transmission lines; radio receiver; radio transmitter; size 0.13 mum; surface roughness; voltage 1.2 V; Conductors; Dielectric losses; Latches; Power transmission lines; Propagation losses; Transmission line measurements;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898816
  • Filename
    5898816