DocumentCode
1734591
Title
Electromagnetic-SPICE modeling and analysis of 3D power network
Author
Xu, Zheng ; Lu, Jian-Qiang ; Webb, Bucknell C. ; Knickerbocker, John U.
Author_Institution
Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
fYear
2011
Firstpage
2171
Lastpage
2178
Abstract
Accurate modeling and estimation of 3D power network electrical performance are vitally important to aid the 3D integration and packaging design. In order to achieve high accuracy, we combine the electromagnetic (EM) and analytic simulations in this work to evaluate the electrical performance of a 3D power network, which consists of Cu through-strata-vias (TSVs), solders, micro-solders, and on-chip power grids. We intentionally partition the real stack-up structure of 3D power network into separated components, electromagnetically extract all the passive elements (resistance, inductance, conductance, and capacitance, i.e., RLGC) for each component at certain frequency points of interest. We then assemble all the components again into a corresponding SPICE model of 3D power network and import EM-extracted RLGC values to analyze the overall 3D system power performance. The number of stacked ICs, floorplanning of TSV/micro-solders, operating frequency of 3D system, and characteristics of decoupling capacitance are examined to unveil several 3D power delivery design implications.
Keywords
SPICE; circuit layout; electronics packaging; solders; three-dimensional integrated circuits; 3D integration; 3D power network; 3D system power performance; Cu through-strata-vias; electrical performance; electromagnetic simulations; electromagnetic-SPICE modeling; floorplanning; microsolders; on-chip power grids; packaging; stacked integrated circuit; Copper; Power grids; Solid modeling; Three dimensional displays; Through-silicon vias; Wires;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
Conference_Location
Lake Buena Vista, FL
ISSN
0569-5503
Print_ISBN
978-1-61284-497-8
Electronic_ISBN
0569-5503
Type
conf
DOI
10.1109/ECTC.2011.5898820
Filename
5898820
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