• DocumentCode
    1734591
  • Title

    Electromagnetic-SPICE modeling and analysis of 3D power network

  • Author

    Xu, Zheng ; Lu, Jian-Qiang ; Webb, Bucknell C. ; Knickerbocker, John U.

  • Author_Institution
    Dept. of Electr., Comput. & Syst. Eng., Rensselaer Polytech. Inst., Troy, NY, USA
  • fYear
    2011
  • Firstpage
    2171
  • Lastpage
    2178
  • Abstract
    Accurate modeling and estimation of 3D power network electrical performance are vitally important to aid the 3D integration and packaging design. In order to achieve high accuracy, we combine the electromagnetic (EM) and analytic simulations in this work to evaluate the electrical performance of a 3D power network, which consists of Cu through-strata-vias (TSVs), solders, micro-solders, and on-chip power grids. We intentionally partition the real stack-up structure of 3D power network into separated components, electromagnetically extract all the passive elements (resistance, inductance, conductance, and capacitance, i.e., RLGC) for each component at certain frequency points of interest. We then assemble all the components again into a corresponding SPICE model of 3D power network and import EM-extracted RLGC values to analyze the overall 3D system power performance. The number of stacked ICs, floorplanning of TSV/micro-solders, operating frequency of 3D system, and characteristics of decoupling capacitance are examined to unveil several 3D power delivery design implications.
  • Keywords
    SPICE; circuit layout; electronics packaging; solders; three-dimensional integrated circuits; 3D integration; 3D power network; 3D system power performance; Cu through-strata-vias; electrical performance; electromagnetic simulations; electromagnetic-SPICE modeling; floorplanning; microsolders; on-chip power grids; packaging; stacked integrated circuit; Copper; Power grids; Solid modeling; Three dimensional displays; Through-silicon vias; Wires;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Components and Technology Conference (ECTC), 2011 IEEE 61st
  • Conference_Location
    Lake Buena Vista, FL
  • ISSN
    0569-5503
  • Print_ISBN
    978-1-61284-497-8
  • Electronic_ISBN
    0569-5503
  • Type

    conf

  • DOI
    10.1109/ECTC.2011.5898820
  • Filename
    5898820