Title :
A New Method for Measuring Aperture Jitter in ADC Output and Its Application to ENOB Testing
Author :
Yamaguchi, Takahiro J. ; Kawabata, Masayuki ; Soma, Mani ; Ishida, Masahiro ; Sawami, Kiyotaka ; Uekusa, Kouichiro
Author_Institution :
Advantest Labs., Ltd., Sendai
Abstract :
This paper proposes a new method for measuring aperture jitter on an ADC output. It measures both the average ENOB loss and the worst-case ENOB loss due to aperture jitter. Because it adds only a negligible computation time to an existing ENOB test, it can also be used in an HV production environment without significantly increasing the overall test time.
Keywords :
analogue-digital conversion; jitter; ADC output; ENOB loss; ENOB testing; HV production environment; aperture jitter; Apertures; Clocks; Distortion measurement; Frequency measurement; Jitter; Sampling methods; Semiconductor device measurement; Signal to noise ratio; Spectral analysis; Testing;
Conference_Titel :
Test Conference, 2008. ITC 2008. IEEE International
Conference_Location :
Santa Clara, CA
Print_ISBN :
978-1-4244-2402-3
Electronic_ISBN :
1089-3539
DOI :
10.1109/TEST.2008.4700639
