مرکز منطقه ای اطلاع رساني علوم و فناوري

DocumentCode :

1735866

Title :

Hot-carriers

Author :

Bravaix, A.

fYear :

1999

fDate :

6/21/1905 12:00:00 AM

Firstpage :

138

Lastpage :

139

Keywords :

Acceleration; Circuits; Degradation; Hot carriers; Low voltage; Ring oscillators; Stress measurement; Tunneling; Voltage control; Voltage measurement;

fLanguage :

English

Publisher :

ieee

Conference_Titel :

Integrated Reliability Workshop Final Report, 1999. IEEE International

Print_ISBN :

0-7803-5649-7

Type :

conf

DOI :

10.1109/IRWS.1999.830577

Filename :

830577

Link To Document :

https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=1735866