DocumentCode :
1739978
Title :
Characterization of attachment techniques for single mode devices
Author :
Green, Evan D H
Author_Institution :
New Focus Inc., Santa Clara, CA, USA
Volume :
2
fYear :
2000
fDate :
2000
Firstpage :
796
Abstract :
For single mode devices intended for deployment in telecommunications applications, not only does the initial placement accuracy need to meet the tolerance described above, but the tolerance is required to be as tight over a wide range of environmental conditions, and for a long lifetime. In order to use the extremely sensitive position measurement capabilities afforded by interferometry, we also developed a test method using high-finesse Fabry-Perot interferometers. By monitoring shifts in the transmitting wavelength of the interferometer, highly accurate length changes can be measured
Keywords :
Fabry-Perot interferometers; light interferometry; measurement errors; optical communication equipment; optical fibre losses; optical testing; sensitivity; attachment techniques; environmental conditions; extremely sensitive position measurement capabilities; high-finesse Fabry-Perot interferometers; highly accurate length changes; initial placement accuracy; long lifetime; monitoring shifts; single mode devices; telecommunications applications; transmitting wavelength; Chemical analysis; Collimators; Laser beams; Lenses; Metrology; Monitoring; Optical fiber devices; Optical fiber polarization; Telecommunications; Throughput;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Lasers and Electro-Optics Society 2000 Annual Meeting. LEOS 2000. 13th Annual Meeting. IEEE
Conference_Location :
Rio Grande
ISSN :
1092-8081
Print_ISBN :
0-7803-5947-X
Type :
conf
DOI :
10.1109/LEOS.2000.894094
Filename :
894094
Link To Document :
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