DocumentCode
1739992
Title
An empirical study on the effects of test type ordering on overall test efficiency
Author
Butler, Kenneth M. ; Saxena, Jayashree
Author_Institution
Texas Instrum. Inc., Dallas, TX, USA
fYear
2000
fDate
2000
Firstpage
408
Lastpage
416
Abstract
The order in which the various test types are applied can have an impact on the overall efficiency of the test operation. Furthermore, the speed at which the tests can be executed and the latency of defect detection are also important factors. In this paper, we evaluate an exhaustive set of test orderings over a variety of assumed execution parameters to analyze their effects on overall tester time consumption
Keywords
automatic testing; integrated circuit testing; production testing; SEMATECH test methods; defect detection latency; execution parameters; overall tester time consumption; test application order; test efficiency; test execution speed; test type ordering; tester program efficiency; Anatomy; Circuit testing; Delay effects; Failure analysis; Instruments; Integrated circuit testing; Logic devices; Logic testing; Manufacturing; Silicon;
fLanguage
English
Publisher
ieee
Conference_Titel
Test Conference, 2000. Proceedings. International
Conference_Location
Atlantic City, NJ
ISSN
1089-3539
Print_ISBN
0-7803-6546-1
Type
conf
DOI
10.1109/TEST.2000.894232
Filename
894232
Link To Document