DocumentCode :
1741141
Title :
Dose calculations with the BEAM Monte Carlo code at extended SSDs
Author :
Stathakis, Sotirios ; Kappas, Constantin ; Papanikolaou, Nikos
Author_Institution :
Dept. of Med. Phys., Patras Univ., Greece
Volume :
3
fYear :
2000
fDate :
2000
Firstpage :
1679
Abstract :
Extended Surface to Skin Distance (SSD) beam data are very useful for hemibody and total body irradiation. Monte Carlo simulation provides an alternative mechanism to calculate the dose for such treatment modalities. Comparison of the Monte Carlo results has been done with measured data of two linear accelerators of 6 MV, with results from two commercial 3D treatment-planning systems and with extrapolated data from measurements at 100 cm SSD. The results from the Monte Carlo simulations agreed with the experimental results within 1% and the PDD curves produced from the TPSs were within 2% error. The extrapolated PDD curves had a deviation of about 2%. It was found that dmax migrated towards the surface with increasing SSD which was predicted by the simulations. Also, the mean photon energy as computed by the simulation was found to be higher at extended SSD which is part of the reason why the PDDs are more penetrating for extended distances
Keywords :
Monte Carlo methods; dosimetry; extrapolation; photon transport theory; radiation therapy; skin; 3D treatment-planning systems; 6 MV; BEAM Monte Carlo code; Monte Carlo simulation; dose calculations; extended surface to skin distance; extrapolated data; hemibody irradiation; linear accelerators; mean photon energy; off axis ratios; percent depth dose; primary fluence; radiotherapy treatment planning; scatter fluence; spectral distribution; total body irradiation; Computational modeling; Geometry; Linear accelerators; Monte Carlo methods; Optical computing; Performance evaluation; Predictive models; Skin; Solid modeling; Surface treatment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE
Conference_Location :
Chicago, IL
ISSN :
1094-687X
Print_ISBN :
0-7803-6465-1
Type :
conf
DOI :
10.1109/IEMBS.2000.900402
Filename :
900402
Link To Document :
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