A new portable electronic device for single exposure half-value layer measurement

Author

Schiabel, Homero ; Vieira, Marcelo A C ; Curi, Newton S M

Author_Institution

Dept. of Electr. Eng., Sao Paulo Univ., Brazil

Volume

4

fYear

2000

fDate

2000

Firstpage

2510

Abstract

A new device to be used for half-value layer (HVL) measurements in quality assurance procedures is presented. This device uses a silicon X-ray sensor coupled to an electronic circuit that is connected to a portable computer (notebook) for data storage and analysis. HVL measurements can be performed for a single X-ray exposure and real-time results are presented on the notebook screen

Keywords

X-ray detection; biomedical electronics; computerised instrumentation; diagnostic radiography; dosimetry; medical diagnostic computing; silicon radiation detectors; Si; attenuation curve; dedicated software; diagnostic radiology; dosimetry; notebook screen; portable computer; portable electronic device; quality assurance procedures; real-time results; silicon X-ray sensor; single X-ray exposure; single exposure half-value layer measurement; Aluminum; Attenuation measurement; Data analysis; Filters; Mechanical sensors; Performance evaluation; Quality assurance; Radiology; Signal generators; Silicon;

fLanguage

English

Publisher

ieee

Conference_Titel

Engineering in Medicine and Biology Society, 2000. Proceedings of the 22nd Annual International Conference of the IEEE

Conference_Location

Chicago, IL

ISSN

1094-687X

Print_ISBN

0-7803-6465-1

Type

conf

DOI

10.1109/IEMBS.2000.901336

Filename

901336